Solution Science for Research and Industry

Posts tagged “thin film

Iridian filters now available from Elliot Scientific

The Iridian range of filters for imaging, fluorescence, Raman and optical spectroscopy is now available in the UK and Ireland through Elliot Scientific.

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Scores of filters designed for bandpass – both short and long, edge pass, narrow notch and dichroic mirrors have been added to our website.

They are used in many spectroscopic investigations such as flow and emission cytometry, excitation and emission fluorescence, and more. Imaging filters for use in machine vision applications are available too.

We can also advise on custom filters for very specific scientific applications, and welcome OEM enquiries.

Please contact us for details, or visit our Iridian pages.


May 2015 Newsletter Out Now

May 2015 NewsletterThe Elliot Scientific May newsletter is now available. In this issue we announce our new E1100 3-channel piezo actuator controller, look at Gamma Scientific’s high volume Thin Film Measurement Systems, get a taste of Vescent’s ICE laser controllers, pump up the diodes with IPG Photonics fibre amplifiers and lasers, and more…

To view it in a browser, click here.

To read it magazine-style online, click here.

To download it as a PDF, click here.


TimePro™ and FilmPro™ introduced by CRAIC

CRAIC Technologies has developed software to measure time-dependent changes of microscopic samples in full UV-VIS-NIR reflectance, absorbance and emission spectra.

The new CRAIC TimePro™ Kinetic Spectroscopy package is designed to be used with Lambdafire™ software equipped CRAIC Technology microspectrophotometers. CRAIC TimePro™ allows the user to monitor changes in the spectra over time, providing a unique and valuable tool for chemists and biological researchers.

CRAIC FilmPro™ is a film thickness measurement software package developed for CRAIC microspectrophotometres equipped with the Lambdafire™ software. It allows the user to rapidly measure the thickness of thin films and analyse many materials on both transparent and opaque substrates. It is ideal for determining the thin film thickness on semiconductors, MEMS devices, disk drives, flat panel displays, and more. This powerful and flexible software can be used in many different fields and in everything from research to industrial settings.

Contact us for more information about these products.