With the UK’s record breaking hot weather continuing, we thought you might like to know that Lake Shore Cryotronics offer four types of sensor for temperature measurement:
A diode temperature sensor is the general name for a class of semiconductor temperature sensors. They are based on the temperature dependence of the forward voltage drop across a p-n junction. The voltage change with temperature depends on the material. The most common is Silicon, but Gallium Arsenide (GaAs) and Gallium Aluminium Arsenide (GaAlAs) are also used.
These sensors are based on the change of resistance with temperature, and can be classified as positive temperature coefficient (PTC) or negative temperature coefficient (NTC). Platinum RTDs are the best example of PTC resistance sensors.
Capacitors are also used for low temperatures, but usually not for temperature measurement. Capacitance temperature sensors have the advantage of being insensitive to magnetic fields, but they commonly experience calibration shifts after thermal cycling.
Thermocouples are only useful where differential temperature measurements or low mass are the main consideration. They must be calibrated in-situ as the entire length of the wire contributes to the output voltage if it traverses a temperature gradient.
Each type sensor has its own particular advantages in terms of temperature range and response, as well as design features and drawbacks, so Elliot Scientific recommends contacting us to discuss your application and its requirements.
Lake Shore also do some nice instruments to go with their sensors!
Data is currently available online for sensors shipped since the beginning of 2016, so if an existing CD is lost or damaged, the calibration data can be quickly downloaded providing you have the serial number of the relevant sensor on hand. Alternatively, contact Lake Shore Service for archived curves.
Lake Shore space-qualified sensors were on the hugely successful Cassini Huygens mission to Saturn that ended earlier this month.
Nearly twenty years of gathering temperature information in an extreme environment is a good advert for their sensors, and Elliot Scientific often supplies them to the aerospace industry and space scientists in the UK and Ireland.
Please contact us for more information.
Lake Shore offers four types of sensor for cryogenic temperature measurement based on voltage (diodes) or resistance. Each has its own advantages and disadvantages, and these can be easily seen at-a-glance via our new Cryogenic Temperature Sensors page.
For example: Of the three most common NTC resistor materials, sputter-deposited zirconium oxy-nitride aka Cernox™ – the others being Germanium and Ruthenium Oxide (Rox™) – is the most versatile. Cernox™ thin film resistors are only manufactured by Lake Shore Cryotronics, and incorporated into robust sensor packages.
Cernox™ works over a broad temperature range, does not follow a standard curve, has sensitivity below 1 K, and is highly resistant to ionising radiation and magnetic field-induced errors. These features can be instantly seen on the page via our colourful graphics:
|♨||0.1 to 420||⌒||✘||❆||✔||☢||✔||⋐||★★★ (1 K +)|
In all, nine different temperature sensor materials are detailed and an informative datasheet is available to download. However, Elliot Scientific still recommends contacting us for expert advice on sensor choice for your application.
Lake Shore has released a new printed catalogue covering their expanded range of cryogenic/cryogen-free and vacuum micro-manipulated Probe Stations for testing the electronic and magneto-transport properties of chips, wafers, and packaged devices.
The 10 systems covered feature variable temperature operation, from 1.6 K to 675 K depending on model, and can accommodate up 4″ wafers with up to 6 probes, again depending on model chosen.
Probes are available for use with signals ranging from DC to 67 GHz, and a combination of both low and high frequency probes can be supplied with a single system.
Additionally, these systems can be configured with horizontal or vertical field superconducting magnets, high-resolution microscopes, and CCD cameras for precision positioning of the probe tips on the wafer or device under test.