Solution Science for Research and Industry

Posts tagged “loss

25 ways precision metrology is enabled via capacitance measurement

Andeen-Hagerling AH2700A Capacitance Bridge Test Instrument

Andeen-Hagerling has been manufacturing class-leading capacitance and capacitance/loss bridge test equipment for over thirty years. Their equipment is used in laboratories worldwide, in a wide variety of research and industrial applications.

These include:

  • Atomic Layer Deposition (ALD)
  • Dielectric characterisation
  • Glasses
  • Spectroscopy
  • Gravity
  • Liquid crystals
  • Magnetometry
  • Low temperature physics
  • Nano-force metrology
  • Quantum Dots
  • Tunneling
  • Dilatometry:
    • Thermal expansion
    • Magnetostriction
  • Biophysics
  • Carbon nanotubes & nanowires
  • Electrical/Capacitance metrology
  • Ferroelectrics
  • Semiconductor testing
  • Precision positioning
  • Pressure/Capacitive Bolometry
  • Scanning Capacitance Microscopy (SCM)
  • Scanning Tunneling Microscopy (STM)
  • Single Electron Tunneling (SET)
  • Structure & Phase transitions
  • Superconductivity & Superfluids
  • Magneto-capacitance, -resistance &
    -dielectric effects

Elliot Scientific is able to offer expert advice on selecting the right Andeen-Hagerling instrument for your project, so please contact us with details of the application and we will be happy to help.


Polarization Dependent Loss is Dominant Performance-limiting Factor

Taliescent PPLS Artefact

Polarization Dependent Loss (PDL) is the dominant performance-limiting factor of high speed optical networks with per-channel bit rates of 10 Gb/s or more, so Elliot Scientific offers solutions for simulation and reduction of PDL in fibre optic networks, and solutions for PMD simulation, from globally renowned calibration artefact supplier Taliescent.

PDL is present to a varied extent in nearly every fibre optic component. In itself, PDL can be detrimental to the performance of both fibre optic telecommunications and test & measurement systems, but it can also interact with Polarization Mode Dispersion (PMD) and lead to increased uncertainty in bit error rates.

For more information on the Taliescent product range, please contact us.


PDL artefacts from Elliot Scientific help cut bit error rates

Taliescent PPLS Artefact

Taliescent PPLS ArtefactPolarization Dependent Loss (PDL) is present to a varied extent in nearly every fibre optic component. In itself, PDL can be detrimental to the performance of both fibre optic telecommunications and test & measurement systems, but it can also interact with Polarization Mode Dispersion (PMD) and lead to increased uncertainty in bit error rates.

PDL is the dominant performance-limiting factor of high speed optical networks with per-channel bit rates of 10 Gb/s or more, so Elliot Scientific offers solutions for simulation and reduction of PDL in fibre optic networks, and solutions for PMD simulation, from globally renowned calibration artefact supplier Taliescent.

For more information on the Taliescent product range, please contact us.